CADSM conference is intended to provide a possibility to discuss problems of optimization of technological processes of IC manufacturing, development of the models and design methods of microelectronics devices and technical systems, problems during the design of microelectromechanical systems and possibilities of practical applications of developed systems.

The problem of reliability testing is considered within the framework of the conference, as well as the new information technologies of automated designing and creation of learning systems.

During the conference, the attendees from all over the world can discuss the problems and opportunities of modern CAD systems and their applications in information technologies, robotics, IoT and medical systems.

CADSM conference